Semiconductor devices - Hot carrier test on MOS transistors
Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
Semiconductor devices - Metallization stress void test
Control technology - Rules for the designation of measuring instruments
Concentric lay stranded overhead electrical conductors containing one or more gap(s)
Electronics assembly technology - Electronic modules
Type F and type B residual current operated circuit-breakers with and without integral overcurrent protection for household and similar uses
Type F and type B residual current operated circuit-breakers with and without integral overcurrent protection for household and similar uses
Type F and type B residual current operated circuit-breakers with and without integral overcurrent protection for household and similar uses
Type F and type B residual current operated circuit-breakers with and without integral overcurrent protection for household and similar uses
Representation of process control engineering - Requests in P&I diagrams and data exchange between P&ID tools and PCE-CAE tools
Electric power engineering - Modal components in three-phase a.c. systems - Quantities and transformations
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