Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers
Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers
Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films
Video systems (625/50 progressive) - Video and accompanied data using the vertical blanking interval - Analogue interface
Maritime navigation and radiocommunication equipment and systems - Electronic chart system (ECS) - Operational and performance requirements, methods of testing and required test results
Common control interface for networked digital audio and video products - Part 1: General
Common control interface for networked digital audio and video products - Part 2: Audio
Common control interface for networked digital audio and video products - Part 3: Video
Common control interface for networked digital audio and video products - Part 5-1: Transmission over networks - General
Common control interface for networked digital audio and video products - Part 5-2: Transmission over networks - Signalling (TA4)
Common Control Interface for networked digital audio and video products - Part 7: Measurements
Automation systems in the process industry - Factory acceptance test (FAT), site acceptance test (SAT) and site integration test (SIT)
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