Semiconductor devices - Mechanical and climatic test methods - Part 34-1: Power cycling test for power semiconductor module
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
Optical fibre cables - Part 1-101: Generic specification - Basic optical cable test procedures - Mechanical tests methods - Tensile, method E1
Optical fibre cables - Part 1-104: Generic specification - Basic optical cable test procedures - Mechanical tests methods - Impact, method E4
Optical fibre cables - Part 1-107: Generic specification - Basic optical cable test procedures - Mechanical test methods - Torsion, method E7
Optical fibre cables - Part 1-110: Generic specification - Basic optical cable test procedures - Mechanical tests methods - Kink, Method E10
Optical fibre cables - Part 1-111: Generic specification - Basic optical cable test procedures - Mechanical tests methods - Bend, method E11
Optical fibre cables - Part 1-117: Generic specification - Basic optical cable test procedures - Mechanical test methods - Bending stiffness, method E17
53,361 odrębnych oznaczeń norm zindeksowanych na podstawie zapisów z oficjalnych źródeł. Uwzględniono wcześniejsze edycje. Indeks i zbiory wydawców mają różny zakres. Zobacz źródła i zakres.