Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing
Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking
Test on gases evolved during combustion of materials from cables - Part 1: Determination of the halogen acid gas content
Test on gases evolved during combustion of materials from cables - Part 1: Determination of the halogen acid gas content
Test on gases evolved during combustion of materials from cables - Part 2: Determination of acidity (by pH measurement) and conductivity
Test on gases evolved during combustion of materials from cables - Part 2: Determination of acidity (by pH measurement) and conductivity
Non-broadcast video tape recorders - Time base stability
Synthetic quartz crystal - Specifications and guidelines for use
Aerospace series - Static seal elements O-Ring ethylene-propylene, moulded, phosphate ester resistant (- 55 °C to 107 °C) - Inch series
53,361 afzonderlijke normreferenties geïndexeerd op basis van vastgelegde officiële bronnen. Eerdere edities zijn inbegrepen. De index en de collecties van uitgevers hebben een verschillende dekking. Zie bronnen en dekking.