Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions
Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
Industrial-process measurement and control - Data structures and elements in process equipment catalogues - Part 100: Data base standard for process measurement, control and automation equipment
Industrial-process measurement and control - Data structures and elements in process equipment catalogues - Part 1: Generic structures for measuring equipment
Industrial-process measurement and control - Data structures and elements in process equipment catalogues - Part 31: List of Properties (LOPs) of infrastructure devices for electronic data exchange - Generic structures
Industrial-process measurement and control - Data structures and elements in process equipment catalogues - Part 32: Lists of properties (LOP) for I/O modules for electronic data exchange
Industrial-process measurement and control - Data structures and elements in process equipment catalogues - Part 41: Lists of properties (LOPs) of process analysers for electronic data exchange - Generic structures
Industrial-process measurement and control - Data structures and elements in process equipment catalogues - Part 92: Lists of properties (LOP) of measuring equipment for electronic data exchange - Aspect LOPs
Nuclear power plants - Instrumentation, control and electrical power systems - Requirements for electromagnetic compatibility testing
Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods
Passive RF and microwave devices, intermodulation level measurement - Part 1: General requirements and measuring methods
53,361 afzonderlijke normreferenties geïndexeerd op basis van vastgelegde officiële bronnen. Eerdere edities zijn inbegrepen. De index en de collecties van uitgevers hebben een verschillende dekking. Zie bronnen en dekking.