Semiconductor devices - Mechanical and climatic test methods - Part 34-1: Power cycling test for power semiconductor module
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
Optical fibre cables - Part 1-101: Generic specification - Basic optical cable test procedures - Mechanical tests methods - Tensile, method E1
Optical fibre cables - Part 1-104: Generic specification - Basic optical cable test procedures - Mechanical tests methods - Impact, method E4
Optical fibre cables - Part 1-107: Generic specification - Basic optical cable test procedures - Mechanical test methods - Torsion, method E7
Optical fibre cables - Part 1-110: Generic specification - Basic optical cable test procedures - Mechanical tests methods - Kink, Method E10
Optical fibre cables - Part 1-111: Generic specification - Basic optical cable test procedures - Mechanical tests methods - Bend, method E11
Optical fibre cables - Part 1-117: Generic specification - Basic optical cable test procedures - Mechanical test methods - Bending stiffness, method E17
53,361 afzonderlijke normreferenties geïndexeerd op basis van vastgelegde officiële bronnen. Eerdere edities zijn inbegrepen. De index en de collecties van uitgevers hebben een verschillende dekking. Zie bronnen en dekking.