Connectors for electronic equipment - Tests and measurements - Part 25-2: Test 25b: Attenuation (insertion loss)
Connectors for electronic equipment - Tests and measurement - Part 25-3: Test 25c - Rise time degradation
Connectors for electronic equipment - Tests and measurements - Part 25-4: Teste25d - Propagation delay
Connectors for electronic equipment - Tests and measurements - Part 25-5: Test 25e - Return loss
Connectors for electronic equipment - Tests and measurements - Part 25-6: Test 25f: Eye pattern and jitter
Connectors for electronic equipment - Tests and measurements - Part 25-7: Test 25g - Impedance, reflection coefficient and voltage standing wave ratio (VSWR)
Connectors for electronic equipment - Tests and measurements - Part 25-9: Signal integrity tests - Test 25i: Alien crosstalk
Connectors for electronic equipment - Tests and measurements - Part 26-100: Measurement setup, test and reference arrangements and measurements for connectors according to IEC 60603-7 - Tests 26a to 26g
Connectors for electronic equipment - Tests and measurements - Part 26-100: Measurement setup, test and reference arrangements and measurements for connectors according to IEC 60603-7 - Tests 26a to 26g
Connectors for electronic equipment - Tests and measurements - Part 27-100: Signal integrity tests up to 500 MHz on IEC 60603-7 series connectors - Tests 27a to 27g
Connectors for electronic equipment - Tests and measurements - Part 29-100: Signal integrity tests up to 500 MHz on M12 style connectors - Tests 29a to 29g
Connectors for electronic equipment - Tests and measurements - Part 3-1: Insulation tests - Test 3a: Insulation resistance
53,361 afzonderlijke normreferenties geïndexeerd op basis van vastgelegde officiële bronnen. Eerdere edities zijn inbegrepen. De index en de collecties van uitgevers hebben een verschillende dekking. Zie bronnen en dekking.