ElectroMagnetic Compatibility and Radio Spectrum Matters (ERM); Short Range Devices (SRD); Technical characteristics and test methods for radio equipment in the frequency range 9 kHz to 25 MHz and inductive loop systems in the frequency range 9 kHz to 30 MHz
ElectroMagnetic Compatibility and Radio Spectrum Matters (ERM); Short Range Devices (SRD); Radio equipment in the frequency range 9 kHz to 25 MHz and inductive loop systems in the frequency range 9 kHz to 30 MHz; Part 1: Technical characteristics and test methods
Electromagnetic compatibility and Radio spectrum Matters (ERM); Short Range Devices (SRD); Radio equipment in the frequency range 9 kHz to 25 MHz and inductive loop systems in the frequency range 9 kHz to 30 MHz; Part 1: Technical characteristics and test methods
Electromagnetic compatibility and Radio spectrum Matters (ERM); Short Range Devices (SRD); Radio equipment in the frequency range 9 kHz to 25 MHz and inductive loop systems in the frequency range 9 kHz to 30 MHz; Part 1: Technical characteristics and test methods
Electromagnetic compatibility and Radio spectrum Matters (ERM); Short Range Devices (SRD); Radio equipment in the frequency range 9 kHz to 25 MHz and inductive loop systems in the frequency range 9 kHz to 30 MHz; Part 1: Technical characteristics and test methods
Electromagnetic compatibility and Radio spectrum Matters (ERM); Short Range Devices (SRD); Radio equipment in the frequency range 9 kHz to 25 MHz and inductive loop systems in the frequency range 9 kHz to 30 MHz; Part 1: Technical characteristics and test methods
V interfaces at the digital Local Exchange (LE); V5.2 interface for the support of Access Network (AN); Part 3: Test Suite Structure and Test Purposes (TSS&TP) specification for the network layer (AN side)
V interfaces at the digital Local Exchange (LE); V5.2 interface for the support of Access Network (AN); Part 4: Abstract Test Suite (ATS) and partial Protocol Implementation eXtra Information for Testing (PIXIT) proforma specification for the network layer (AN side)
V interfaces at the digital Local Exchange (LE); V5.2 interface for the support of Access Network (AN); Part 5: Test Suite Structure and Test Purposes (TSS&TP) specification for the network layer (LE side)
V interfaces at the digital Local Exchange (LE); V5.2 interface for the support of Access Network (AN); Part 6: Abstract Test Suite (ATS) and partial Protocol Implementation eXtra Information for Testing (PIXIT) proforma specification for the network layer (LE side)
V interfaces at the digital Local Exchange (LE); V5.2 interface for the support of Access Network (AN); Part 8: Abstract Test Suite (ATS) and partial Protocol Implementation eXtra Information for Testing (PIXIT) proforma specification for the data link layer
Integrated Services Digital Network (ISDN); Signalling System No.7; ISDN User Part (ISUP) version 3 for the international interface; Part 32: Test Suite Structure and Test Purposes (TSS&TP) specification for basic services
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