Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking
Semiconductor devices - Mechanical and climatic test methods
Semiconductor devices - Mechanical and climatic test methods
Semiconductor devices - Mechanical and climatic test methods
Insulating and sheathing materials of electric and optical cables - Common test methods - Part 1-1: General application - Measurement of thickness and overall dimensions - Tests for determining the mechanical properties
Insulating and sheathing materials of electric and optical cables - Common test methods - Part 1-1: General application - Measurement of thickness and overall dimensions - Tests for determining the mechanical properties
Winding wires - Test methods - Part 3: Mechanical properties
Winding wires - Test methods - Part 3: Mechanical properties
Winding wires - Test methods - Part 3: Mechanical properties
Winding wires - Test methods - Part 3: Mechanical properties
Winding wires - Test methods - Part 3: Mechanical properties
Winding wires - Test methods - Part 3: Mechanical properties
53,361 afzonderlijke normreferenties geïndexeerd op basis van vastgelegde officiële bronnen. Eerdere edities zijn inbegrepen. De index en de collecties van uitgevers hebben een verschillende dekking. Zie bronnen en dekking.