Semiconductor devices - Hot carrier test on MOS transistors
Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
Semiconductor devices - Metallization stress void test
Control technology - Rules for the designation of measuring instruments
Concentric lay stranded overhead electrical conductors containing one or more gap(s)
Electronics assembly technology - Electronic modules
Type F and type B residual current operated circuit-breakers with and without integral overcurrent protection for household and similar uses
Type F and type B residual current operated circuit-breakers with and without integral overcurrent protection for household and similar uses
Type F and type B residual current operated circuit-breakers with and without integral overcurrent protection for household and similar uses
Type F and type B residual current operated circuit-breakers with and without integral overcurrent protection for household and similar uses
Representation of process control engineering - Requests in P&I diagrams and data exchange between P&ID tools and PCE-CAE tools
Electric power engineering - Modal components in three-phase a.c. systems - Quantities and transformations
53,361 afzonderlijke normreferenties geïndexeerd op basis van vastgelegde officiële bronnen. Eerdere edities zijn inbegrepen. De index en de collecties van uitgevers hebben een verschillende dekking. Zie bronnen en dekking.