Reliability growth - Stress testing for early failures in unique complex systems
Reflectivity of electromagnetic wave absorbers in millimetre wave frequency - Measurement methods
EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)
EMC IC modelling - Part 3: Models of Integrated Circuits for EMI behavioural simulation - Radiated emissions modelling (ICEM-RE)
EMC IC modelling - Part 4: Models of integrated circuits for RF immunity behavioural simulation - Conducted immunity modelling (ICIM-CI)
Electronic components - Long-term storage of electronic semiconductor devices - Part 1: General
Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms
Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die and wafer devices
Industrial communication networks - High availability automation networks - Part 1: General concepts and calculation methods
Industrial communication networks - High availability automation networks - Part 1: General concepts and calculation methods
Industrial communication networks - High availability automation networks - Part 1: General concepts and calculation methods
Industrial communication networks - High availability automation networks - Part 4: Cross-network Redundancy Protocol (CRP)
53,361 afzonderlijke normreferenties geïndexeerd op basis van vastgelegde officiële bronnen. Eerdere edities zijn inbegrepen. De index en de collecties van uitgevers hebben een verschillende dekking. Zie bronnen en dekking.