Industrial-process measurement and control - Data structures and elements in process equipment catalogues - Part 16: Lists of properties (LOPs) for density measuring equipment for electronic data exchange
Industrial-process measurement and control - Data structures and elements in process equipment catalogues - Part 1: Measuring equipment with analogue and digital output
Plasma display panels - Part 2-1: Measuring methods - Optical and optoelectrical
Plasma display panels - Part 2-3: Measuring methods - Image quality: defects and degradation
Plasma display panels - Part 2-4: Measuring methods - Visual quality: Image artifacts
Plasma display panels - Part 2-5: Measuring methods - Acoustic noise
Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods
Semiconductor devices - Micro-electromechanical devices - Part 13: Bend- and shear- type test methods of measuring adhesive strength for MEMS structures
Semiconductor devices - Micro-electromechanical devices - Part 14: Forming limit measuring method of metallic film materials
Semiconductor devices - Micro-electromechanical devices - Part 17: Bulge test method for measuring mechanical properties of thin films
Live working - Telescopic sticks and telescopic measuring sticks
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
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