Semiconductor devices - Micro-electromechanical devices - Part 5: RF MEMS switches
Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials
Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection
Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films
Semiconductor devices - Micro-electromechanical devices - Part 9: Wafer to wafer bonding strength measurement for MEMS
Electricity metering equipment (a.c.) - General requirements, tests and test conditions - Part 21: Tariff and load control equipment
Electricity metering equipment (AC) - General requirements, tests and test conditions - Part 21: Tariff and load control equipment
Electricity metering equipment (AC) - General requirements, tests and test conditions - Part 21: Tariff and load control equipment
Electricity metering equipment (AC) - General requirements, tests and test conditions - Part 31: Product safety requirements and tests
Electricity metering equipment (a.c.) - Particular requirements - Part 11: Electromechanical meters for active energy (classes 0,5, 1 and 2)
Electricity metering equipment (a.c.) - Particular requirements - Part 11: Electromechanical meters for active energy (classes 0,5, 1 and 2)
Electricity metering equipment (a.c.) - Particular requirements - Part 11: Electromechanical meters for active energy (classes 0,5, 1 and 2)
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