Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions
Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
Industrial-process measurement and control - Data structures and elements in process equipment catalogues - Part 100: Data base standard for process measurement, control and automation equipment
Industrial-process measurement and control - Data structures and elements in process equipment catalogues - Part 1: Generic structures for measuring equipment
Industrial-process measurement and control - Data structures and elements in process equipment catalogues - Part 31: List of Properties (LOPs) of infrastructure devices for electronic data exchange - Generic structures
Industrial-process measurement and control - Data structures and elements in process equipment catalogues - Part 32: Lists of properties (LOP) for I/O modules for electronic data exchange
Industrial-process measurement and control - Data structures and elements in process equipment catalogues - Part 41: Lists of properties (LOPs) of process analysers for electronic data exchange - Generic structures
Industrial-process measurement and control - Data structures and elements in process equipment catalogues - Part 92: Lists of properties (LOP) of measuring equipment for electronic data exchange - Aspect LOPs
Nuclear power plants - Instrumentation, control and electrical power systems - Requirements for electromagnetic compatibility testing
Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods
Passive RF and microwave devices, intermodulation level measurement - Part 1: General requirements and measuring methods
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