Connectors for electronic equipment - Tests and measurements - Part 25-2: Test 25b: Attenuation (insertion loss)
Connectors for electronic equipment - Tests and measurement - Part 25-3: Test 25c - Rise time degradation
Connectors for electronic equipment - Tests and measurements - Part 25-4: Teste25d - Propagation delay
Connectors for electronic equipment - Tests and measurements - Part 25-5: Test 25e - Return loss
Connectors for electronic equipment - Tests and measurements - Part 25-6: Test 25f: Eye pattern and jitter
Connectors for electronic equipment - Tests and measurements - Part 25-7: Test 25g - Impedance, reflection coefficient and voltage standing wave ratio (VSWR)
Connectors for electronic equipment - Tests and measurements - Part 25-9: Signal integrity tests - Test 25i: Alien crosstalk
Connectors for electronic equipment - Tests and measurements - Part 26-100: Measurement setup, test and reference arrangements and measurements for connectors according to IEC 60603-7 - Tests 26a to 26g
Connectors for electronic equipment - Tests and measurements - Part 26-100: Measurement setup, test and reference arrangements and measurements for connectors according to IEC 60603-7 - Tests 26a to 26g
Connectors for electronic equipment - Tests and measurements - Part 27-100: Signal integrity tests up to 500 MHz on IEC 60603-7 series connectors - Tests 27a to 27g
Connectors for electronic equipment - Tests and measurements - Part 29-100: Signal integrity tests up to 500 MHz on M12 style connectors - Tests 29a to 29g
Connectors for electronic equipment - Tests and measurements - Part 3-1: Insulation tests - Test 3a: Insulation resistance
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