Plasma display panels - Part 2-2: Measuring methods - Optoelectrical
Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods
High frequency inductive components - Electrical characteristics and measuring methods - Part 1: Nanohenry range chip inductor
High frequency inductive components - Electrical characteristics and measuring methods - Part 1: Nanohenry range chip inductor
High frequency inductive components - Electrical characteristics and measuring methods - Part 2: Rated current of inductors for DC to DC converters
High frequency inductive components - Non-electrical characteristics and measuring methods - Part 1: Fixed, surface mounted inductors for use in electronic and telecommunication equipment
High frequency inductive components - Non-electrical characteristics and measuring methods - Part 1: Fixed, surface mounted inductors for use in electronic and telecommunication equipment
High frequency inductive components - Non-electrical characteristics and measuring methods - Part 2: Test methods for non-electrical characteristics
Passive RF and microwave devices, intermodulation level measurement - Part 1: General requirements and measuring methods
Cores made of soft magnetic materials - Measuring methods - Part 1: Generic specification
Cores made of soft magnetic materials - Measuring methods - Part 2: Magnetic properties at low excitation level
Cores made of soft magnetic materials - Measuring methods - Part 2: Magnetic properties at low excitation level
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