Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers
Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers
Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films
Video systems (625/50 progressive) - Video and accompanied data using the vertical blanking interval - Analogue interface
Maritime navigation and radiocommunication equipment and systems - Electronic chart system (ECS) - Operational and performance requirements, methods of testing and required test results
Common control interface for networked digital audio and video products - Part 1: General
Common control interface for networked digital audio and video products - Part 2: Audio
Common control interface for networked digital audio and video products - Part 3: Video
Common control interface for networked digital audio and video products - Part 5-1: Transmission over networks - General
Common control interface for networked digital audio and video products - Part 5-2: Transmission over networks - Signalling (TA4)
Common Control Interface for networked digital audio and video products - Part 7: Measurements
Automation systems in the process industry - Factory acceptance test (FAT), site acceptance test (SAT) and site integration test (SIT)
53,361 distinct reference strings indexed from official source snapshots. Includes earlier editions. The index and publisher collections have different coverage. See sources and coverage.