Connectors for electronic equipment - Tests and measurements - Part 16-2: Mechanical tests on contacts and terminations - Test 16b: Restricted entry
Connectors for electronic equipment - Tests and measurements - Part 16-3: Mechanical tests on contacts and terminations - Test 16c: Contact-bending strength
Connectors for electronic equipment - Tests and measurements - Part 16-4: Mechanical tests on contacts and terminations - Test 16d: Tensile strength (crimped connections)
Connectors for electronic equipment - Tests and measurements - Part 16-5: Mechanical tests on contacts and terminations - Test 16e: Gauge retention force (resilient contacts)
Connectors for electronic equipment - Tests and measurements - Part 16-6: Mechanical tests on contacts and terminations - Test 16f: Robustness of terminations
Connectors for electronic equipment - Tests and measurements - Part 16-7: Mechanical tests on contacts and terminations - Test 16g: Measurement of contact deformation after crimping
Connectors for electronic equipment - Tests and measurements - Part 16-8: Mechanical tests on connections and terminations - Test 16h: Insulating grip effectiveness (crimped connections)
Connectors for electronic equipment - Tests and measurements - Part 16-9: Mechanical tests on contacts and terminations - Test 16i: Grounding contact spring holding force
Connectors for electronic equipment - Tests and measurements - Part 7-2: Impact tests (free connectors) - Test 7b: Mechanical strength impact
Connectors for electronic equipment - Tests and measurements - Part 9-1: Endurance tests - Test 9a: Mechanical operation
Connectors for electronic equipment - Tests and measurements - Part 9-3: Endurance tests - Test 9c: Mechanical operation (engaging/separating) with electrical load
Operating conditions for industrial-process measurement and control equipment - Part 3: Mechanical influences
53,361 distinct reference strings indexed from official source snapshots. Includes earlier editions. The index and publisher collections have different coverage. See sources and coverage.