Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing
Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking
Optical fibre cables - Part 1-21: Generic specification - Basic optical cable test procedures - Mechanical tests methods
Optical fibre cables - Part 1-21: Generic specification - Basic optical cable test procedures - Mechanical tests methods
Electric and optical fibre cables - Test methods for non-metallic materials - Part 501: Mechanical tests - Tests for determining the mechanical properties of insulating and sheathing compounds
Electric and optical fibre cables - Test methods for non-metallic materials - Part 501: Mechanical tests - Tests for determining the mechanical properties of insulating and sheathing compounds
Electric and optical fibre cables - Test methods for non-metallic materials - Part 501: Mechanical tests - Tests for determining the mechanical properties of insulating and sheathing compounds
Electric and optical fibre cables - Test methods for non-metallic materials - Part 502: Mechanical tests - Shrinkage test for insulations
Electric and optical fibre cables - Test methods for non-metallic materials - Part 503: Mechanical tests - Shrinkage test for sheaths
Electric and optical fibre cables - Test methods for non-metallic materials - Part 503: Mechanical tests - Shrinkage test for sheaths
53,361 distinct reference strings indexed from official source snapshots. Includes earlier editions. The index and publisher collections have different coverage. See sources and coverage.