Reference details

Reference
EN IEC 60749-20-1:2026
Official title
Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat
Organisation
CENELEC
Publisher status in source
PublishedThis is the status recorded in the source, not a statement that this is the latest edition.
Source access
19 October 2026

Research and application

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Product research routes

Questions for the evidence file

  • Configuration and installation basis
  • Environmental qualification
  • Material and process traceability
  • Approval scope

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